Rigaku MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control.

MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer.

Features

• New 6^thgeneration design
• Compact, fail-safe radiation enclosure
• Incident beam variable slit
• Simple installation and user training
• Factory aligned goniometer system
• Laptop computer operation

Measurements:

• Phase identification
• Phase quantification (phase ID)
• Percent (%) crystallinity
• Crystallite size and strain
• Lattice parameter refinement
• Rietveld refinement
• Molecular structure